A unified, macroscopic, one-dimensional model is presented for the quantitative description of the process of dielectric charging in RF MEMS switches. The fidelity of the model relies upon the utilization of experimentally-obtained data to assign values to model parameters that capture the non-linear behavior of the dielectric charging process. The proposed model can be easily cast in the form a simple SPICE circuit. Its compact,physics-based form enables its seamless insertion in non-linear, SPICE-like, circuit simulators and makes it compatible with system-level MEMS computer-aided analysis and design tools. The model enables the efficient simulation of dielectric charging
under different, complex control voltage waveforms. In addition, it provides the means for expedient simulation of the impact of dielectric charging on switch performance degradation.